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Optimization of InGaAsN(Sb)/GaAs quantum dots for optical emission at 1.55 µm with low optical degradation

机译:InGaAsN(Sb)/ GaAs量子点的优化,用于1.55 µm的光发射,且光降解小

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摘要

Low optical degradation in GaInAsN(Sb)/GaAs quantum dots (QDs) p–i–n structures emitting up to 1.55 μm is presented in this paper. We obtain emission at different energies by means of varying N content from 1 to 4%. The samples show a low photoluminescence (PL) intensity degradation of only 1 order of magnitude when they are compared with pure InGaAs QD structures, even for an emission wavelength as large as 1.55 μm. The optimization studies of these structures for emission at 1.55 μm are reported in this work. High surface density and homogeneity in the QD layers are achieved for 50% In content by rapid decrease in the growth temperature after the formation of the nanostructures. Besides, the effect of N and Sb incorporation in the redshift and PL intensity of the samples is studied by post-growth rapid thermal annealing treatments. As a general conclusion, we observe that the addition of Sb to QD with low N mole fraction is more efficient to reach 1.55 μm and high PL intensity than using high N incorporation in the QD. Also, the growth temperature is determined to be an important parameter to obtain good emission characteristics. Finally, we report room temperature PL emission of InGaAsN(Sb)/GaAs at 1.4 μm.
机译:本文介绍了GaInAsN(Sb)/ GaAs量子点(QDs)p–i–n结构中的低光降解,其发射高达1.55μm。我们通过将N含量从1%更改为4%来获得不同能量下的发射。与纯InGaAs QD结构相比,样品的光致发光(PL)强度降低幅度仅为1个数量级,即使发射波长高达1.55μm。这项工作报告了这些结构在1.55μm处发射的优化研究。 In含量为50%时,通过在纳米结构形成后迅速降低生长温度,可以在QD层中实现高表面密度和均匀性。此外,通过生长后快速热退火处理研究了氮和锑掺入对样品红移和PL强度的影响。作为一般结论,我们观察到,向QD中添加低N摩尔分数的Sb比在QD中使用高氮掺入更有效地达到1.55μm和高PL强度。而且,生长温度被确定为获得良好的发射特性的重要参数。最后,我们报告了InGaAsN(Sb)/ GaAs在1.4μm的室温PL发射。

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