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Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS)

机译：通过扫描电子显微镜/硅漂移检测器能量色散X射线光谱法（SEM / SDD-EDS）进行高精度和高精度的元素微分析

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Dale E. Newbury; Nicholas W. M. Ritchie;
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1. Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS) [J] . Dale E. Newbury, Nicholas W. M. Ritchie Journal of Materials Science . 2015,第2期

机译：通过扫描电子显微镜/硅漂移检测器能量色散X射线光谱法（SEM / SDD-EDS）进行高精度和高精度的元素微分析
2. Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS) [J] . Newbury Dale E., Ritchie Nicholas W. M. Journal of Materials Science . 2015,第2期

机译：通过扫描电子显微镜/硅漂移检测器能量色散X射线光谱法（SEM / SDD-EDS）进行高精度和高精度的元素微分析
3. Quantitative Electron-Excited X-Ray Microanalysis of Borides, Carbides, Nitrides, Oxides, and Fluorides with Scanning Electron Microscopy/Silicon Drift Detector Energy-Dispersive Spectrometry (SEM/SDD-EDS) and NIST DTSA-II [J] . Newbury Dale E., Ritchie Nicholas W. M. Microscopy and microanalysis: The official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada . 2015,第5期

机译：扫描电子显微镜/硅漂移检测器能量色散光谱（SEM / SDD-EDS）和NIST DTSA-II对硼化物，碳化物，氮化物，氧化物和氟化物的电子激发X射线定量分析
4. SCANNING ELECTRON MICROSCOPY/ENERGY DISPERSIVE X-RAY SPECTROMETRY (SEM/EDS) ELEMENTAL MICROANALYSIS: ACCURACY AND PRECISION BEYOND MY WILDEST DREAMS [C] . Dale E. Newbury, Nicholas W.M. Ritchie Materials Science and Technology Conference . 2016

机译：扫描电子显微镜/能量分散X射线光谱（SEM / EDS）元素微量分析：比我最疯狂的梦想的准确性和精度
5. Individual particle analysis of suspended particulate matter in New York City drinking water reservoirs by scanning electron microscopy interfaced with x-ray microanalysis and image analysis. [D] . Peng, Feng. 2002

机译：通过与X射线显微分析和图像分析相结合的扫描电子显微镜，对纽约市饮用水水库中悬浮颗粒物的单个颗粒进行分析。
6. Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS) [O] . Dale E. Newbury, Nicholas W. M. Ritchie -1

机译：通过扫描电子显微镜/硅漂移检测器能量色散X射线光谱法（SEM / SDD-EDS）进行高精度和高精度的元素微分析
7. High Spatial Resolution Quantification X-ray Microanalysis in a Field Emission Scanning Electron Microscope with an Annular Silicon Drift Detector [O] . Hendrix Demers, Nicolas Brodusch, Patrick Woo, 2015

机译：具有环形硅漂移探测器的场发射扫描电子显微镜中的高空间分辨率定量X射线微分析
8. SEM 2000; Scanning Electron Microscopy: Imaging and Microanalysis [R] . Petersson, J., Pettersson, A. 2000

机译：sEm 2000;扫描电子显微镜：成像和微量分析

Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS)

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