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Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures

机译：多波长异常衍射和衍射异常精细结构研究半导体纳米结构的组成和应变

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V. Favre-Nicolin; M. G. Proietti; C. Leclere; N. A. Katcho; M. -I. Richard; H. Renevier;
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1. Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures MAD and DAFS for studying Semiconductor Nanostructures [J] . V. Favre-Nicolin, M. G. Proietti, C. Leclere, The European Physical Journal - Special Topics . 2012,第1期

机译：多波长异常衍射和衍射异常精细结构研究半导体纳米结构MAD和DAFS的组成和应变，用于研究半导体纳米结构
2. Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures [J] . V. Favre-Nicolin, M.G.Proietti, C.Leclere, The European physical journal: Special topics . 2012,第Null期

机译：多波长异常衍射和衍射异常精细结构研究半导体纳米结构的组成和应变
3. Strain, size and composition of InAs quantum sticks, embedded in InP, determined via X-ray anomalous diffraction and diffraction anomalous fine structure in grazing incidence [J] . Letoublon A, Favre-Nicolin V, Renevier H, Physica, B. Condensed Matter . 2005,第1a2期

机译：通过X射线反常衍射和掠射入射中的衍射反常精细结构确定嵌入InP中的InAs量子棒的应变，大小和组成
4. InGaN selfassembled quantum dots investigated by x-ray diffraction-anomalous-fine structure technique [C] . E. Piskorska, V. Holy, M. Siebert, International Conference on the Physics of Semiconductors . 2007

机译：由X射线衍射 - 异常结构技术研究INGAN自动臂量子点
5. Multiwavelength anomalous diffraction analyses of protein structures based on xenon and selenium resonances. [D] . Slama, Betty Nicole. 2008

机译：基于氙和硒共振的蛋白质结构的多波长异常衍射分析。
6. Selenomethionyl proteins produced for analysis by multiwavelength anomalous diffraction (MAD): a vehicle for direct determination of three-dimensional structure. [O] . W A Hendrickson, J R Horton, D M LeMaster 1990

机译：通过多波长异常衍射（MAD）分析产生的硒代蛋氨酸蛋白：直接确定三维结构的载体。
7. Multiwavelength anomalous diffraction (MAD) and diffraction anomalous fine structure (DAFS) in the study of structural properties of nanostructures [O] . H. Renevier, J. Coraux, M. G. Proietti, 2007

机译：多波长异常衍射（MAD）和衍射异常细结构（DAF）研究纳米结构的结构性能
8. X-Ray-Absorption Edge Separation Using Diffraction Anomalous Fine-Structure. [R] . Ravel, B., Bouldin, C. E., Renevier, H., 1998

机译：利用衍射异常精细结构进行X射线吸收边缘分离。

Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures

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