Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing

摘要

At-speed scan testing, based on ATPG and ATE, is indispensable to guarantee timing-related test quality in the DSM era. However, at-speed scan testing may incur yield loss due to excessive IR-drop caused by high test (shift & capture) switching activity. This paper discusses the mechanism of circuit malfunction due to IR-drop, and summarizes general approaches to reducing switching activity, by which highlights the problem of current solutions, i.e. only reducing switching activity for one capture while the widely used at-speed scan testing based on the launch-off-capture scheme uses two captures. This paper then proposes a novel X-filling method, called double-capture (DC) X-filling, for generating test vectors with low and balanced capture switching activity for two captures. Applicable to dynamic & static compaction in any ATPG system, DC X-filling can reduce IR-drop, and thus yield loss, without any circuit/clock modification, timing/circuit overhead, fault coverage loss, and additional design effort.