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Self-limiting MBE growth and characterization of three-dimensionally confined nanostructures on patterned GaAs(311)A substrates

机译:GaAs(311)A衬底上MBE的自限生长和三维受限纳米结构的表征

摘要

The formation of triangular-shaped dot-like (TD) structures grown by molecular beam epitaxy on GaAs (311)A substrates patterned with square- and triangular-shaped holes is compared. On substrates patterned with square-shaped holes, TD structures are formed via the pinch-off of two symmetrically arranged {111} planes which develop freely in the regions between the holes on the original substrate surface, while the (111)A sidewalls of the as-etched holes develop a rough morphology during growth. The evolution of the rough ( 1 1 1)A sidewalls is eliminated on substrates patterned with triangular shaped holes resulting in similar TD structures with highly improved uniformity over the entire pattern. Spectrally and spatially resolved cathodoluminescence spectroscopy reveals the lateral variation of the quantum-well confinement energy in the TD structures generating distinct lateral energy barriers between the top portion and the nearby smooth regions with efficient radiative recombination. Formation of TD structures provides a new approach Do fabricate three-dimensionally confined nanostructures in a controlled manner.
机译:比较了分子束外延在带有正方形和三角形孔的GaAs(311)A衬底上生长的三角形点状(TD)结构的形成。在带有正方形孔的基板上,通过夹住两个对称排列的{111}平面形成TD结构,该平面在原始基板表面上的孔之间的区域中自由发展,而基板的(111)A侧壁腐蚀后的孔在生长过程中会形成粗糙的形态。粗糙((1 1 1)A)侧壁的演变在带有三角形孔图案的基板上得以消除,从而得到了类似的TD结构,在整个图案上具有高度改善的均匀性。光谱和空间分辨的阴极荧光光谱揭示了TD结构中量子阱限制能量的横向变化,从而在顶部和附近的平滑区域之间产生了有效的辐射重组,产生了明显的横向能垒。 TD结构的形成提供了一种新的方法。以受控的方式制造三维受限的纳米结构。

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