The LFSR and BCA VHDL Models for Built-in Self-test Circuits

摘要

The various test structures are proposed for BIST techniques [1], [2]. A typical structure used for generation of pseudo-random test sets is the linear feedback shift register (LFSR). The BIST techniques have wide application in testing whole devices and embedded components. We focus on the analysis of the state coverage, fault coverage, and optimal structure of BIST schemes.