Measurement and Simulation of Coaxial to Microstrip Transitions' Radiation Properties and Substrate Influence

摘要

A radiation and electro-magnetic (EM) field analysis of coaxial-to-microstrip transitions is presented. Radiation is quantified by simulation and measurement of a crosstalk between two Omni-Spectra's transitions using microstrip 'open' calibration standards at different positions. Simulation results are compared to the measured data and good agreement is reported on two different substrates. The evaluation method which is used to analyze quality of the transition and its radiation properties was already developed and verified on a grounded coplanar waveguide (CPWG) transmission line. Results can be used to estimate uncertainty budget of the calibrated measurement with respect to the measured radiation. Results on different substrates show interesting behaviour and can prove useful when choosing suitable substrate for specific test-fixture.