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Characterization of critical current density in silver-sheathed Bi-2223 tape

机译:银鞘Bi-2223胶带中的临界电流密度的表征

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摘要

The critical current property of a superconducting Bi-2223 tape produced by the over pressure processing at the final heat treatment was investigated. The critical current density increased by a factor of 1.6-1.8 at 77.3 K in comparison with the tape produced by the usual process. Thus, the critical current increased in spite of a reduction in the filament thickness. It was also found that the irreversibility field increased by a factor of 1.34 at 77.3 K by the new process. As a result, the enhancement of the critical current density at higher fields is remarkable. These results suggest that the over pressure process not only enriches the mass concentration of the superconducting phase but also contributes to the c-axis alignment. This is supported directly by the reduction of FWHM of rocking curve and indirectly by an enhancement the n value. The critical current property at lower temperatures is also investigated and the possibility of the further improvement of the property is discussed.
机译:研究了在最终热处理中通过超压处理生产的超导Bi-2223胶带的临界电流特性。与通过常规方法生产的胶带相比,临界电流密度在77.3 K时增加了1.6-1.8倍。因此,尽管灯丝厚度减小,但临界电流仍增加。还发现通过新过程,不可逆场在77.3 K处增加了1.34倍。结果,在较高磁场下临界电流密度的提高是显着的。这些结果表明,超压过程不仅丰富了超导相的质量浓度,而且有助于c轴对齐。这可以通过降低摇摆曲线的FWHM直接获得支持,而可以通过提高n值间接获得支持。还研究了低温下的临界电流特性,并讨论了进一步改善该特性的可能性。

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