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Construction of X-Ray Computer Tomographic Apparatus using Borrmann Effect to Reveal Defect Structures in Bulky Silicon Crystals

机译：利用Borrmann效应揭示大体积硅晶体缺陷结构的X射线计算机断层摄影设备的构造

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作者
村田俊一; 城井英樹; 鈴木芳文; 近浦吉則;
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年度 1994
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原文格式 PDF
正文语种 ja
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入库时间 2022-08-20 20:10:34

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1. Three-Dimensional Structure and Defects in Colloidal Photonic Crystals Revealed by Tomographic Scanning Transmission X-ray Microscopy [J] . Jan Hilhorst, † Matti M. van Schooneveld, ‡ Jian Wang, Langmuir . 2012,第7期

机译：层析扫描透射X射线显微镜揭示的胶体光子晶体的三维结构和缺陷。
2. Three-dimensional structure and defects in colloidal photonic crystals revealed by tomographic scanning transmission x-ray microscopy [J] . Hilhorst J., Van Schooneveld M.M., Wang J., Langmuir: The ACS Journal of Surfaces and Colloids . 2012,第7期

机译：断层扫描透射X射线显微镜显示的胶体光子晶体的三维结构和缺陷
3. Study of structural defects in ZnGeP2 crystals by X-ray topography based on the Borrmann effect [J] . Okunev AO, Verozubova GA, Trukhanov EM, Journal of Applied Crystallography . 2009,第6期

机译：基于Borrmann效应的X射线形貌研究ZnGeP2晶体的结构缺陷
4. Dislocation Elimination in Czochralski Silicon Crystal Growth Revealed by White X-ray Topography Combined with Topo-tomographic Technique [C] . Seiji Kawado, Satoshi Iida, Kentaro Kajiwara, International Conference on Synchrotron Radiation Instrumentation . 2007

机译：白X射线地形与顶部断层技术结合的Czochralski硅晶体生长中的脱位消除
5. Analysis of Defect Structures in 4H Silicon Carbide Bulk Crystals, Epitaxial Layers and Power Devices [D] . Guo, Jianqiu. 2018

机译：4H碳化硅散装晶体，外延层和功率装置的缺陷结构分析
6. Nanoscale characterization of local structures and defects in photonic crystals using synchrotron-based transmission soft X-ray microscopy [O] . Hyun Woo Nho, Yogesh Kalegowda, Hyun-Joon Shin, -1

机译：使用基于同步加速器的透射软X射线显微镜对光子晶体中的局部结构和缺陷进行纳米级表征
7. Three-Dimensional Structure and Defects in Colloidal Photonic Crystals Revealed by Tomographic Scanning Transmission X-ray Microscopy [O] . Jan Hilhorst, Matti M. van Schooneveld, Jian Wang, 2012

机译：断层扫描透射X射线显微镜显影胶体光子晶体的三维结构和缺陷
8. Characterization of Defect Structures in Lely 6H-SiC Single Crystals usingSynchrotron White Beam X-Ray Topography [R] . Huang, W., Wang, S., Dudley, M., 1995

机译：使用异步加速器白光束X射线形貌表征Lely 6H-siC单晶中的缺陷结构

Construction of X-Ray Computer Tomographic Apparatus using Borrmann Effect to Reveal Defect Structures in Bulky Silicon Crystals

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