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Optical degradation of indium tin oxide thin films induced by hydrogen-related room temperature reduction

机译:氢相关室温还原引起的铟锡氧化物薄膜的光降解

摘要

The optical degradation of indium tin oxide (ITO) thin films due to a hydrogen-related room temperature reduction reaction was reported. The thin films were treated in an electrolysis process. Significant decrease in the optical transmission of the treated samples was observed. Compositional and structural changes in ITO caused by the reaction related to atomic hydrogen generated in the electrolysis of water was found to be responsible for the degradation. X-ray diffraction and scanning electron microcopy (SEM) observations were employed in the analysis of the products yielded in the reduction reaction.
机译:据报道,由于氢相关的室温还原反应,铟锡氧化物(ITO)薄膜会发生光降解。在电解过程中处理薄膜。观察到处理后样品的光学透射率显着降低。发现由与水电解中产生的原子氢有关的反应引起的ITO的组成和结构变化是造成降解的原因。 X射线衍射和扫描电子显微镜(SEM)观察用于分析还原反应中产生的产物。

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