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Signed frequency offset measurement for direct detection DPSK system with a chromatic dispersion offset

机译:用于直接检测色散偏移的DPSK系统的有符号频偏测量

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摘要

We demonstrated a method for the measurement of signed frequency offset between optical source and delay interferometer (DI) for 10Gb/s DPSK signals based on asynchronous delay-tap sampling technique with a chromatic dispersion (CD) offset. The demodulated DPSK signals show asymmetrical property and amplitude shoulder appears on the waveforms with frequency offset and a fixed CD offset together. The delay-tap sampling scatter plots also show the asymmetry related to the asymmetrical signal distortion. Our proposed method cannot only realize the measurement of the magnitude of frequency offset but also the polarity. The measurement range is from −2GHz to + 2GHz and the sensitivity can reach ± 100MHz. The simulation and experimental results are demonstrated and in good agreement.
机译:我们演示了一种基于异步延迟抽头采样技术和色散(CD)偏移量的10Gb / s DPSK信号的光源和延迟干涉仪(DI)之间的有符号频率偏移量的测量方法。解调后的DPSK信号显示出不对称特性,振幅肩出现在具有频率偏移和固定CD偏移的波形上。延迟抽头采样散点图还显示了与不对称信号失真有关的不对称性。我们提出的方法不仅可以实现频偏幅度的测量,还可以实现极性的测量。测量范围为−2GHz至+ 2GHz,灵敏度可以达到±100MHz。仿真结果与实验结果吻合良好。

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