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Study of local piezoelectric properties for europium doped lead zirconate titanate films by piezoresponse force microscope

机译:压电响应力显微镜研究euro掺杂锆钛酸铅钛薄膜的局部压电性能

摘要

Using a sol-gel method, rare earth element europium (Eu) doped lead zirconate titanate (Pb0.925Eu0.05(Zr0.52Ti 0.48)O3, denoted as PEZT) films were obtained. A novel method was proposed to measure the PEZT film's local piezoelectric properties by piezoresponse force microscope tip utilizing wire bonding through which external electric field was applied. Relative piezoelectric coefficient ("d33") and the strain behavior (butterfly loop) of the PEZT films described as the function of electric field were obtained by using this method. The oscillation amplitude against the ac voltage curve is linear, revealing a slope of 3.78 × 10-5 V/V, and the coercive field estimated from the butterfly loop has a mean value of 27.5 kV/cm. The butterfly loops obtained from different places can be used to describe the transfer and attenuation of the domain vibration in PEZT films.
机译:使用溶胶-凝胶法,获得了掺杂稀土元素euro(Eu)的锆钛酸铅钛酸盐(Pb0.925Eu0.05(Zr0.52Ti 0.48)O3,表示为PEZT)薄膜。提出了一种新的方法,通过利用线键合施加外部电场的压敏力显微镜尖端,测量PEZT膜的局部压电性能。通过使用该方法,可获得描述为电场函数的PEZT膜的相对压电系数(“ d33”)和应变行为(蝴蝶环)。相对于交流电压曲线的振荡幅度是线性的,显示出3.78×10-5 V / V的斜率,并且从蝶形环路估算出的矫顽场的平均值为27.5 kV / cm。从不同位置获得的蝶形环可用于描述PEZT薄膜中域振动的传递和衰减。

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