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Highly c-axis oriented CaRuO3 thin films on LaAlO3 buffered Si(100) substrates by pulsed laser deposition

机译:通过脉冲激光沉积在LaAlO3缓冲的Si(100)衬底上的高c轴取向CaRuO3薄膜

摘要

Highly c-axis oriented CaRuO3 thin films were prepared on LaAlO3 buffered Si(100) substrates at 650°C by pulsed laser deposition. The buffer layer had a significant effect on the microstructure and electrical properties of the subsequent CaRuO3 thin films. Typical columnar grown CaRuO3 films were available using LaAlO3 as a buffer layer, although the buffer layer was not well-crystallized at the deposition temperature. The resistivity of the highly oriented CaRuO 3 thin film was 287.8 μΩ·cm at room temperature. The film showed typical metallic behaviour and its resistivity was sufficiently low to be used as a buffer layer in superconductor tapes or electrode materials in dielectrics devices.
机译:通过脉冲激光沉积在650°C的LaAlO3缓冲的Si(100)衬底上制备了高c轴取向的CaRuO3薄膜。缓冲层对随后的CaRuO3薄膜的微观结构和电学性能有重大影响。使用LaAlO3作为缓冲层可以获得典型的柱状生长的CaRuO3膜,尽管该缓冲层在沉积温度下并未很好地结晶。高取向的CaRuO 3薄膜在室温下的电阻率为287.8μΩ·cm。该膜表现出典型的金属行为,其电阻率足够低,可以用作超导带中的缓冲层或介电设备中的电极材料。

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