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Measurement and Simulation of Microwave Noise Transient of InP/InGaAs DHBT with Polyimide Passivattion

机译:聚酰亚胺钝化法对InP / InGaAs DHBT微波噪声瞬态的测量和仿真

摘要

Measurement and simulation of microwave noise transient of InP/InGaAs DHBT with polyimide passivation is reported in this paper for the first time and is believed to contribute to the overall broadband shot noise. This work provides a better insight into the noise transient mechanism of InP HBTs due to polyimide passivation and can be used to improve the device and circuit reliability.
机译:本文首次报道了采用聚酰亚胺钝化处理的InP / InGaAs DHBT微波噪声瞬变的测量和模拟,相信对整个宽带散粒噪声有贡献。这项工作为因聚酰亚胺钝化而导致的InP HBT的噪声瞬变机制提供了更好的见解,可用于提高器件和电路的可靠性。

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