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Modelling characterisation of a Ka-band monolithic PHEMT low-noise feedback amplifier

机译:Ka波段单片PHEMT低噪声反馈放大器的建模与表征

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摘要

The modelling and test of a single stage and a two-stage monolithic millimetre-wave (Ka-Band) pseudomorphic HEMT feedback amplifier is reported. The amplifiers used 0.25µm x 120µm devices and were processed on 200µm thick GaAs wafers. The PHEMT s-parameters were measured on-wafer to 40GHz in conjunction with on-wafer Line-Reflect-Line (LRL) calibration standards, which are described. The amplifier modelling approach combined a device equivalent circuit model with a fullwave analysis of the microstrip features and selected measurement-based foundry models. Measured and fitted data are compared for the PHEMT device and for the amplifiers. A single stage feedback amplifier gain of 7.8dB was measured at 33.8GHz and a two-stage feedback amplifier gain of 13.2dB ± 0.4dB from 28.6GHz to 37.9GHz. Both measurements were in good agreement with simulations. The on-wafer measured noise figure of the two stage amplifier was 3.4dB at 35GHz.
机译:报道了单级和两级单片毫米波(Ka-Band)拟态HEMT反馈放大器的建模和测试。该放大器使用0.25µm x 120µm器件,并在200µm厚的GaAs晶片上进行了处理。 PHEMT s参数在晶圆上测量至40GHz,并结合晶圆上的线反射线(LRL)校准标准进行了描述。放大器建模方法将器件等效电路模型与微带特征的全波分析以及选定的基于测量的铸造模型结合在一起。比较PHEMT设备和放大器的测量数据和拟合数据。在33.8GHz处测得的单级反馈放大器增益为7.8dB,在28.6GHz至37.9GHz范围内测得的两级反馈放大器增益为13.2dB±0.4dB。两种测量均与模拟吻合良好。在35GHz时,两级放大器在晶片上测得的噪声系数为3.4dB。

著录项

  • 作者

    Lang Richard; Blount Paul;

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  • 年度 1994
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