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Influence of 0-level packaging on the microwave performance of RF-MEMS devices

机译:0级封装对RF-MEMS器件微波性能的影响

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摘要

RF-MEMS devices (Radio Frequency-MicroElectroMechanical Systems) are made of moveable and fragile structures (membranes, beams, cantilevers,…) that must be encapsulated for protection and for stable performance characteristics. Zero-level or wafer-level packaging developed so far has been limited to dc-components. This paper elaborates on the design and fabrication of a 0-level package for housing RF-MEMS devices. The fabrication process is described and packages are characterized in terms of mechanical strength, hermeticity and microwave performance in the range 1-50 GHz. Simulations and experiments show minimal impact of the package on the RF losses if the cap has a minimal height of 50 µm, if low-loss materials (e.g., glass) are used, and if matched RF feedthroughs are implemented. Finally, in a multi-switch design, we recommend to minimize the number of feedthroughs, i.e. to use a single cap for the entire design.
机译:RF-MEMS器件(射频微机电系统)由可移动且易碎的结构(膜,梁,悬臂等)制成,必须对其进行封装以提供保护和稳定的性能特征。迄今为止,开发的零级或晶圆级封装仅限于直流组件。本文详细介绍了用于容纳RF-MEMS器件的0级封装的设计和制造。描述了制造过程,并根据机械强度,密封性和1-50 GHz范围内的微波性能对封装进行了表征。仿真和实验表明,如果盖的最小高度为50 µm,并且使用低损耗材料(例如玻璃),并且实现了匹配的RF馈通,则封装对RF损失的影响最小。最后,在多开关设计中,我们建议最小化馈通的数量,即在整个设计中使用单个盖帽。

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