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10-40GHz design in SiGe-BiCMOS and Si-CMOS –udlinking technology and circuits to maximizeudperformance

机译:SiGe-BiCMOS和Si-CMOS中的10-40GHz设计– ud连接技术和电路以最大化 ud性能

摘要

This paper reviews the relevance of theudwidely used device metrics fT, fmax as well as the recentlyudintroduced device metrics fA and fcross for broadband circuituddesign. Usually, IC processes are benchmarked on the basisudof their fT and fmax. For most circuit applications however,udthere is only an indirect relation between fT, fmax and circuitudbandwidths. Since the differential pair amplifier is a keyudbuilding block in broadband circuits, the metric fA providesuda nearly direct relation to broadband circuit performance.udThis is demonstrated via the maximum operating frequencyudof a current-mode logic frequency divider, processed in 3udgenerations of a BiCMOS process. Metric fcross is valuableudfor the design of circuits employing a cross-coupleduddifferential pair as active negative resistance, such as in LCVCOs.udThe metrics can be expressed in terms of transistorudparameters (e.g., Rb, Cbc, …), allowing to derive a linkudbetween circuit performance and technology. Based on ourudexperience, we evaluate IC processes on the basis of fT, fAudand fcross rather than fT and fmax.
机译:本文回顾了广泛使用的设备指标fT,fmax以及最近未引入的设备指标fA和fcross与宽带电路 uddesign的相关性。通常,以IC的fT和fmax为基准对IC工艺进行基准测试。但是,对于大多数电路应用来说, fT,fmax和电路 udbandwidths之间只有一个间接关系。由于差分对放大器是宽带电路中的关键 udbuilding块,因此度量标准fA可以提供与宽带电路性能几乎直接的联系。 ud这通过电流模式逻辑分频器的最大工作频率 ud进行了演示, BiCMOS工艺的3 udgeneration。对于使用交叉耦合的 uddifferential对作为有源负电阻的电路设计,例如在LCVCO中,度量交叉是很有价值的。允许得出电路性能与技术之间的联系。根据我们的经验,我们根据fT,fA udand fcross而不是fT和fmax评估IC工艺。

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