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A 26-40 GHz on wafer intermodulation measurement system

机译:26-40 GHz晶圆上互调测量系统

摘要

In this paper, a 26 - 40 GHz intermodulation measurement system is presented which permits intermodulation investigations together with load-pull measurements. The one-tone and two-tone responses of Ka PHEMT devices are compared. Inter Modulation Ratio (IMR) optimizations performed by adjusting the output load and bias settings show that it is possible to improve the IMR up to 5-6 dB at a constant output power level.
机译:在本文中,提出了一种26-40 GHz互调测量系统,该系统允许进行互调研究以及负载拉力测量。比较了Ka PHEMT设备的单音和双音响应。通过调节输出负载和偏置设置进行的互调比(IMR)优化表明,在恒定的输出功率水平下,可以将IMR提高到5-6 dB。

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