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Design to reliability shielded vertical interconnection applied to microwave Chip Scale Packaging

机译:设计用于微波芯片级封装的可靠性屏蔽垂直互连

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摘要

This paper presents the electrical design, measurement and reliability ests of a shielded vertical interconnection dedicated to microwave solder-mount packages. Electromagnetic simulations show very good results up to 20 GHz. Test samples have been designed and manufactured. Electrical results are in accordance with the simulations with insertion loss lower than 0.1 dB up to 20 GHz for the proposed interconnection. Reliability tests of present no degradation of the after 500 thermal cycles in the [-55°C, +125°C] temperature range.
机译:本文介绍了专用于微波焊料安装封装的屏蔽垂直互连的电气设计,测量和可靠性。电磁仿真显示高达20 GHz的非常好的结果。测试样品已经设计和制造。电气结果与仿真结果相符,对于拟议的互连,插入损耗在20 GHz以下时低于0.1 dB。可靠性测试表明,在[-55°C,+ 125°C]温度范围内,经过500个热循环后,性能没有下降。

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