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Integer Charge Transfer and Hybridization at an Organic Semiconductor/Conductive Oxide Interface

机译:在有机半导体/导电氧化物界面的整数电荷转移和杂交

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摘要

We investigate the prototypical hybrid interface formed between PTCDA and conductive n-doped ZnO films by means of complementary optical and electronic spectroscopic techniques. We demonstrate that shallow donors in the vicinity of the ZnO surface cause an integer charge transfer to PTCDA, which is clearly restricted to the first monolayer. By means of DFT calculations, we show that the experimental signatures of the anionic PTCDA species can be understood in terms of strong hybridization with localized states (the shallow donors) in the substrate and charge back-donation, resulting in an effectively integer charge transfer across the interface. Charge transfer is thus not merely a question of locating the Fermi level above the PTCDA electron-transport level but requires rather an atomistic understanding of the interfacial interactions. The study reveals that defect sites and dopants can have a significant influence on the specifics of interfacial coupling and thus on carrier injection or extraction.
机译:我们通过互补的光学和电子光谱技术研究了在PTCDA和导电的n掺杂ZnO薄膜之间形成的原型混合界面。我们证明,ZnO表面附近的浅施主会导致整数电荷转移到PTCDA,这显然仅限于第一个单层。通过DFT计算,我们表明,阴离子PTCDA物种的实验特征可以通过与底物中的局部状态(浅供体)进行强杂交以及电荷回馈来理解,从而产生有效的整数电荷转移接口。因此,电荷转移不仅是将费米能级定位在PTCDA电子传输能级之上的问题,而且还需要对界面相互作用进行原子上的理解。该研究表明,缺陷位点和掺杂剂可能对界面耦合的细节产生重大影响,从而对载流子的注入或提取产生重大影响。

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