首页> 外文OA文献 >Modeling of Semiconductors and Correlated Oxides with Point Defects by First Principles Methods
【2h】

Modeling of Semiconductors and Correlated Oxides with Point Defects by First Principles Methods

机译:用第一原理方法建模具有点缺陷的半导体和相关氧化物

摘要

Point defects in silicon, vanadium dioxide, and doped ceria are investigated by density functional theory. Defects involving vacancies and interstitial oxygen and carbon in silicon are after formed in outer space and significantly affect device performances. The screened hybrid functional by Heyd-Scuseria-Ernzerhof is used to calculate formation energies, binding energies, and electronic structures of the defective systems because standard density functional theory underestimates the bang gap of silicon. The results indicate for the A-center a −2 charge state. Tin is proposed to be an effective dopant to suppress the formation of A-centers. For the total energy difference between the A- and B-type carbon related G-centers we find close agreement with the experiment. The results indicate that the C-type G-center is more stable than both the A- and B-types.The electronic structures of the monoclinic and rutile phases of vanadium dioxide are also studied using the Heyd-Scuseria-Ernzerhof functional. The ground states of the pure phases obtained by calculations including spin polarization disagree with the experimental observations that the monoclinic phase should not be magnetic, the rutile phase should be metallic, and the monoclinic phase should have a lower total energy than the rutile phase. By tuning the Hartree-Fock fraction α to 10% the agreement with experiments is improved in terms of band gaps and relative energies of the phases. A calculation scheme is proposed to simulate the relationship between the transition temperature of the metal-insulator transition and the dopant concentration in tungsten doped vanadium dioxide. We achieve good agreement with the experimental situation.18.75% and 25% yttrium, lanthanum, praseodymium, samarium, and gadolinium doped ceria supercells generated by the special quasirandom structure approach are employed to investigate the impact of doping on the O diffusion. The experimental behavior of the conductivity for the different dopants is understood in terms of the calculated lattice constants and the O migration barriers obtained from nudged elastic band calculations.
机译:通过密度泛函理论研究了硅,二氧化钒和掺杂的二氧化铈中的点缺陷。在外层空间中形成的缺陷包括硅中的空位,间隙氧和碳,这些缺陷会严重影响器件性能。 Heyd-Scuseria-Ernzerhof筛选出的杂合功能用于计算缺陷系统的形成能,结合能和电子结构,因为标准密度泛函理论低估了硅的爆炸间隙。结果表明,对于A中心,-2电荷状态。锡被认为是抑制A中心形成的有效掺杂剂。对于A型和B型碳相关的G中心之间的总能量差,我们发现与实验非常吻合。结果表明C型G中心比A型和B型都稳定。通过包括自旋极化在内的计算获得的纯相的基态与实验观察结果不一致,即单斜相不应为磁性,金红石相应为金属,单斜相的总能量应低于金红石相。通过将Hartree-Fock分数α调整为10%,与实验的一致性在带隙和相的相对能量方面得到了改善。提出了一种计算方案,以模拟金属-绝缘体转变温度与钨掺杂二氧化钒中掺杂剂浓度之间的关系。我们与实验情况取得了很好的吻合。采用特殊的准随机结构方法生成的钇,镧,、,和g掺杂的二氧化铈超级电池分别占18.75%和25%,以研究掺杂对O扩散的影响。根据计算出的晶格常数和从轻推的弹性带计算获得的O迁移势垒,可以理解不同掺杂剂的电导率的实验行为。

著录项

  • 作者

    Wang Hao;

  • 作者单位
  • 年度 2014
  • 总页数
  • 原文格式 PDF
  • 正文语种 en
  • 中图分类

相似文献

  • 外文文献
  • 中文文献
  • 专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号