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Magnetic ordering in Ho-doped Bi2Te3 topological insulator thin films

机译:Ho掺杂Bi2Te3拓扑绝缘体薄膜中的磁序

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摘要

We investigate the magnetic properties of Ho-doped Bi2Te3 thin films grown by molecular beam epitaxy. Analysis of the polarized x-ray absorption spectra at the Ho M5 absorption edge gives an effective 4f magnetic moment which is ~45% of the Hund's rule ground state value. X-ray magnetic circular dichroism (XMCD) shows no significant anisotropy, which suggests that the reduced spin moment is not due to the crystal field effects, but rather the presence of non-magnetic orantiferromagnetic Ho sites. Extrapolating the temperature dependence of the XMCD measured in total electron yield and fluorescence yield mode in a field of 7 T gives a Curie-Weiss temperature of \theta_CW ~ -30 K, which suggests antiferromagnetic ordering, in contrast to the paramagnetic behavior observed with SQUID magnetometry. From the anomaly of the XMCD signal at low temperatures, a Neel temperature TN between 10 K and 25 K is estimated.
机译:我们研究了通过分子束外延生长的Ho掺杂Bi2Te3薄膜的磁性。对Ho M5吸收边缘的极化X射线吸收光谱进行分析,得出有效4f磁矩,约为Hund规则基态值的45%。 X射线磁性圆二色性(XMCD)没有显示出明显的各向异性,这表明自旋矩的减小不是由于晶场效应,而是由于存在非磁性的反铁磁Ho位。外推在7 T场中以总电子产量和荧光产量模式测得的XMCD的温度依赖性,居里-魏斯温度为\ theta_CW〜-30 K,这表明反铁磁有序,与SQUID观察到的顺磁行为相反磁力计。根据低温下XMCD信号的异常,可以估算出Neel温度TN在10 K和25 K之间。

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