首页> 外文OA文献 >Métrologie des nanoparticules dans un plasma froid capacitif basse pression : développement de diagnostics de métrologie des nanoparticules
【2h】

Métrologie des nanoparticules dans un plasma froid capacitif basse pression : développement de diagnostics de métrologie des nanoparticules

机译:低压电容冷等离子体中的纳米计量学:纳米计量学诊断技术的发展

摘要

Dust nanoparticles metrology has become a major scientific and industrial issue in order to control the characteristics of nano-objects (size, density, etc.). For industrial interests it concerns processes control and monitoring, manufactured products quality, human being and environment protection. It is therefore, crucial to find innovative methods of characterization and easy to implement and to handle. The objective of this research program was to develop and optimize solutions for characterizing nanoparticles in dry process and environment using a plasma (promoting disagglomeration of the studied powders). The presence of nanoparticles substantially altering the electrical characteristics of the plasma, we have, at first, developed a diagnostic based on the electrical characteristics of the discharge and the plasma. This method allows the determination the average nanoparticles size and concentration trapped in the plasma gas phase. Then, in a second step, we developed a diagnostic based on multi-angle laser light scattering, allowing us to get the size and the average density of the nanoparticles in the plasma, but also their refractive index. We finally focused our interest on the optimization of the plasma-assisted sedimentation of nanoparticles to obtain their size distribution especially for particles having sizes below 10 nm. The correlation of these three diagnostics gives us, so an efficient and reliable diagnostic for the global characterization in terms of size, density and optical properties of nanoparticles trapped in the plasma.
机译:为了控制纳米物体的特性(尺寸,密度等),粉尘纳米颗粒计量学已成为一个重大的科学和工业问题。为了工业利益,它涉及过程控制和监视,制成品的质量,人员和环境保护。因此,至关重要的是找到创新的表征方法,并且易于实施和处理。该研究计划的目的是开发和优化解决方案,以使用等离子体在干燥过程和环境中表征纳米颗粒(促进研究粉末的团聚)。纳米粒子的存在实质上改变了等离子体的电特性,首先,我们基于放电和等离子体的电特性开发了一种诊断方法。该方法允许确定捕获在等离子体气相中的平均纳米颗粒尺寸和浓度。然后,在第二步中,我们开发了基于多角度激光散射的诊断程序,使我们能够获取等离子体中纳米粒子的大小和平均密度,以及它们的折射率。最后,我们将注意力集中在优化纳米颗粒的等离子体辅助沉降上以获得其尺寸分布,特别是对于尺寸小于10 nm的颗粒。这三种诊断方法的相关性为我们提供了一种有效而可靠的诊断方法,可对捕获在血浆中的纳米颗粒的大小,密度和光学性质进行全局表征。

著录项

  • 作者

    Hénault Marie;

  • 作者单位
  • 年度 2015
  • 总页数
  • 原文格式 PDF
  • 正文语种 fr
  • 中图分类
  • 入库时间 2022-08-20 20:24:40

相似文献

  • 外文文献
  • 中文文献
  • 专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号