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Ohmic contacts to n-type germanium with low specific contact resistivity

机译:与n型锗的欧姆接触,接触电阻率低

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摘要

A low temperature nickel process has been developed that produces Ohmic contacts to n-type germanium with specific contact resistivities down to (2.3 ± 1.8) Ã\u97 10 -7 Ω-cm 2 for anneal temperatures of 340 °C. The low contact resistivity is attributed to the low resistivity NiGe phase which was identified using electron diffraction in a transmission electron microscope. Electrical results indicate that the linear Ohmic behaviour of the contact is attributed to quantum mechanical tunnelling through the Schottky barrier formed between the NiGe alloy and the heavily doped n-Ge. © 2012 American Institute of Physics.
机译:已开发出一种低温镍工艺,该工艺可产生与n型锗的欧姆接触,其比接触电阻率低至(2.3±1.8)ü9710 -7μ-cm2,适用于340°C的退火温度。低接触电阻率归因于在透射电子显微镜中使用电子衍射鉴定的低电阻率NiGe相。电学结果表明,该接触的线性欧姆行为归因于通过NiGe合金与重掺杂n-Ge之间形成的肖特基势垒的量子力学隧穿。 ©2012美国物理研究所。

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