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Electronic structure of quasicrystalline surfaces: Effects of surface preparation and bulk structure

机译:准晶表面的电子结构:表面制备和整体结构的影响

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摘要

We elucidate the nature of the surface electronic properties of quasicrystalline Al-Pd-Mn. We do this by using photoelectron and Auger electron spectroscopies, and by making a variety of comparisons—across types of bulk samples, and across methods of surface preparation. The main conclusions are these: (i) The narrow Mn 2p3/2core-level line observed in the icosahedral phase is a fingerprint of a suppression in the density of states (a pseudogap) at the Fermi level and is not unique to the quasicrystalline phase. It is also independent of the symmetry of the quasicrystalline surface. The Auger line shape is also affected and may be used as a fingerprint of a pseudogap. (ii) A similarly narrow Fe 2p3/2 core-level line characterizes the icosahedral Al-Cu-Fe quasicrystal, consistent with the expectation that the electronic structure is of general importance in the stabilization of icosahedral phases. (iii) In icosahedral Al-Pd-Mn, the pseudogap of the bulk is not retained up to the surface immediately after fracture, but can be restored by annealing, or by sputter annealing to sufficiently high temperatures. Assuming that the pseudogap reflects an electronic stabilization of the atomic structure, these results suggest that the heat-treated surfaces are more stable than the surface obtained by fracturing at room temperature.
机译:我们阐明准晶体Al-Pd-Mn的表面电子性质的性质。我们通过使用光电子和俄歇电子能谱法,以及对各种类型的散装样品以及不同的表面制备方法进行各种比较来做到这一点。主要结论如下:(i)在二十面体相中观察到的窄Mn 2p3 / 2核能级线是在费米能级抑制态密度(伪间隙)的指纹,并且不是准晶相所独有的。它也与准晶体表面的对称性无关。俄歇线的形状也会受到影响,并且可以用作伪间隙的指纹。 (ii)类似窄的Fe 2p3 / 2核能级线表征了二十面体Al-Cu-Fe准晶体,这与人们期望的电子结构在稳定二十面体相中具有普遍意义有关。 (iii)在二十面体Al-Pd-Mn中,块的假间隙不能在断裂后立即保留到表面,而是可以通过退火或通过溅射退火至足够高的温度来恢复。假设伪间隙反映了原子结构的电子稳定性,这些结果表明,经热处理的表面比通过在室温下压裂获得的表面更稳定。

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