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ZrSiOx/IGZO heterojunctions band offsets determined by X-ray photoelectron spectroscopy

机译：X射线光电子能谱法测定ZrSiOx / IGZO异质结的带隙

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David C. Hays; Hays David C.; Gila B.P.; Pearton S.J.; Ren F.;
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1. ZrSiOx/IGZO heterojunctions band offsets determined by X-ray photoelectron spectroscopy [J] . Hays David C., Gila B. P., Pearton S. J., Vacuum: Technology Applications & Ion Physics: The International Journal & Abstracting Service for Vacuum Science & Technology . 2015,第Pta1期

机译：X射线光电子能谱法测定ZrSiOx / IGZO异质结的带隙
2. Large conduction band offset at SiO2/-Ga2O3 heterojunction determined by X-ray photoelectron spectroscopy [J] . Konishi Keita, Kamimura Takafumi, Wong Man Hoi, Physica status solidi, B. Basic research . 2016,第4期

机译：X射线光电子能谱法测定SiO2 / -Ga2O3异质结处的大导带偏移
3. Band offsets in HfTiO/InGaZnO4 heterojunction determined by X-ray photoelectron spectroscopy [J] . He G., Chen X. F., Lv J. G., Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics . 2015,第Null期

机译：X射线光电子能谱法测定HfTiO / InGaZnO4异质结中的能带偏移
4. Band Alignment of h-BN/Al_(0.7)Ga_(0.3)N heterojunction determined by x-ray photoelectron spectroscopy [C] . Guo-Dong Hao, Sachiko Tsuzuki, Shin-ichiro Inoue 2018年第79回応用物理学会秋季学術講演会講演予稿集 . 2018

机译：X射线光电子能谱法测定h-BN / Al_（0.7）Ga_（0.3）N异质结的能带对准
5. Characterization of Heterojunction Band Offsets by In Situ Photoemission Spectroscopy利用統計を見る [D] . Hashimoto Yoshio 1993

机译：异质结带偏移的原位光发射光谱表征参见使用统计
6. Band Offset Measurements in Atomic-Layer-Deposited Al2O3/Zn0.8Al0.2O Heterojunction Studied by X-ray Photoelectron Spectroscopy [O] . Baojun Yan, Shulin Liu, Yuekun Heng, 2017

机译：X射线光电子能谱研究原子层沉积Al2O3 / Zn0.8Al0.2O异质结中的能带偏移测量
7. ZrSiOx/IGZO heterojunctions band offsets determined by X-ray photoelectron spectroscopy [O] . Department of Materials Science and Engineering University of Florida Gainesville FL 32611 USA ( host institution ), Hays David C. ( UF author ), Gila B.P. ( UF author ), 2015

机译：X射线光电子能谱法测定ZrSiOx / IGZO异质结的带隙

ZrSiOx/IGZO heterojunctions band offsets determined by X-ray photoelectron spectroscopy

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