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Concentration quenching of Eu-related luminescence in Eu-doped GaN

机译:Eu掺杂GaN中Eu相关发光的浓度猝灭

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摘要

The dependence of Europium (Eu)-related luminescence intensity on the Eu concentration in Eu-doped GaN was studied. This luminescence is observed at 622 nm and originates from the intra-4f transition of the Eu3+ ion. The intensity of the luminescence increased with increasing Eu concentration, up to about 2 at. %, and then abruptly decreased. It was found that polycrystalline growth began to be induced at Eu concentrations of more than 2 at. %. In addition, clear evidence for the formation of EuN compounds was obtained by x-ray diffraction and extended x-ray absorption fine structure analysis. The cause of the concentration quenching is likely to be related to the polycrystalline growth as well as EuN formation.
机译:研究了Eu掺杂GaN中。相关发光强度对Eu浓度的依赖性。在622 nm处观察到这种发光,它起源于Eu3 +离子的4f内跃迁。发光强度随着Eu浓度的增加而增加,最高可达约2 at.。 %,然后突然下降。发现在Eu浓度大于2at。%时开始诱导多晶生长。 %。另外,通过X射线衍射和扩展的X射线吸收精细结构分析获得了形成EuN化合物的明确证据。浓度猝灭的原因可能与多晶的生长以及EuN的形成有关。

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