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Evaluation methods of polycrystalline materials by X-ray diffractometers : 'epsilon- tau-' scan method and SXDM/XPD

机译：用X射线衍射仪评价多晶材料的方法：“ε-和τ-”扫描法和SXDM / XPD

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Thesis (Ph.D. in Science)--University of Tsukuba, (B), no. 766, 1992.3.25

机译：论文（理学博士学位）-筑波大学，（B），没有。 766，1992.3.25

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Yukino Ken; ユキノケン;
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年度 1992
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正文语种 ja
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Evaluation methods of polycrystalline materials by X-ray diffractometers : 'epsilon- tau-' scan method and SXDM/XPD

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