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Evaluation of digital x-ray detectors for medical imaging applications

机译:评估用于医学成像应用的数字X射线探测器

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摘要

Digital x-ray detectors are now the detector of choice in many X-ray examinations. They have been accepted into clinical practice over the past decade but there are still ongoing developments in the technology. Complementary metal oxide semiconductor (CMOS) active pixel sensors (APS) are a novel digital technology that offers advantages compared to some of the more established approaches (charge-coupled devices (CCD), thin film transistor arrays (TFT) and CMOS passive pixel sensors (PPS)). This thesis looks at the performance of these new sensors and attempts to identify their role in future medical imaging applications. Standard electro-optical and x-ray performance evaluations of two novel CMOS APS, namely the large Area Sensor (LAS) and Dexela CMOS x-ray detector, are presented. The evaluation was made in terms of the photon transfer curve (PTC), the modulation transfer function (MTF), the normalized noise power spectrum (NNPS) and the resultant detective quantum efficiency (DQE). Modifications were introduced to extend the standard methods to overcome technical limitations. The performance of these detectors was compared to three commercial systems (Remote RadEye HR (CMOS APS), Hamamatsu C9732DK (CMOS PPS) and Anrad SMAM (a-Se TFT)) at beam qualities (28 kV for mammography and 52 kV and 74 kV for general radiography) based on the IEC standards. Both the LAS and Dexela CMOS detectors demonstrate enhanced performance. The effect of the CMOS APS inherent nonlinearity on the x-ray performance was also evaluated. Finally, the measured performance parameters were used to simulate images for different mammographic imaging tasks in order to establish possible areas of application for the new sensors. Two software phantoms (one representing a 3-D breast and the other the CDMAM test tool) were used to simulate a range of mammographic conditions. The results show that both novel CMOS APS detectors offer high image quality compared to the commercial detector systems.
机译:现在,数字X射线探测器是许多X射线检查中选择的探测器。在过去的十年中,它们已被临床实践所接受,但该技术仍在不断发展。互补金属氧化物半导体(CMOS)有源像素传感器(APS)是一种新颖的数字技术,与某些更成熟的方法(电荷耦合器件(CCD),薄膜晶体管阵列(TFT)和CMOS无源像素传感器)相比,具有优势(PPS))。本文着眼于这些新型传感器的性能,并试图确定它们在未来医学成像应用中的作用。介绍了两种新型CMOS APS(即大面积传感器(LAS)和Dexela CMOS X射线检测器)的标准电光和X射线性能评估。根据光子传递曲线(PTC),调制传递函数(MTF),归一化噪声功率谱(NNPS)和所得的探测量子效率(DQE)进行了评估。引入了修改以扩展标准方法以克服技术限制。将这些检测器的性能与三种商业系统(远程RadEye HR(CMOS APS),Hamamatsu C9732DK(CMOS PPS)和Anrad SMAM(a-Se TFT))在光束质量(乳腺摄影的28 kV,52 kV和74 kV)下进行了比较。用于一般射线照相),基于IEC标准。 LAS和Dexela CMOS检测器均显示出增强的性能。还评估了CMOS APS固有非线性对X射线性能的影响。最后,所测得的性能参数被用来模拟不同乳腺X线摄影任务的图像,以便为新传感器建立可能的应用领域。使用两个软件模型(一个代表3-D乳房,另一个代表CDMAM测试工具)来模拟一系列乳房X光检查条件。结果表明,与商用检测器系统相比,这两种新型CMOS APS检测器均提供高图像质量。

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    Konstantinidis A.;

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  • 年度 2011
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  • 原文格式 PDF
  • 正文语种 eng
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