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Mechanical fatigue assessment of SAC305 solder joints under harmonic vibrations

机译:SAC305焊点在谐波振动下的机械疲劳评估

摘要

Vibration-induced solder joint fatigue is a main reliability concern for aerospace and military industries whose electronic equipment used in the field is required to remain functional under such loading. Due to the RoHS directive which eventually will prevent lead from being utilized in electronic systems, there is a need for a better understanding of lead-free mechanical behavior under vibration conditions. This study reports the durability of Sn3.0Ag0.5Cu (SAC305) solder joints subjected to harmonic solicitations at three specific temperatures (-55°C, 20°C and 105°C). A test assembly is designed and consists in a single daisy-chained 1152 I/O ball grid array (FBGA1152) package assembled on a flame retardant (FR-4) printed circuit board (PCB). The vibration levels are imposed by a controlled deflection at the center of the board at its natural frequency. The electric continuity is monitored to determine the number of cycles to failure of each sample. Mode shape measurements with a scanning vibrometer are also conducted and correlated with Finite Element Analysis (FEA) to ensure accurate calculation of stress within the critical solder balls at the corners of the component. The failed specimens are then cross-sectioned in order to determine failure modes. A comparison of SAC305 durability with SnPb36Ag2 solder is given, along with a set of lifetime measurements for two complementary assemblies: 68 I/O Leadless Chip Carrier (LCC68) and 324 I/O Plastic Ball Grid Array (PBGA324). It turns out that SAC305 outperforms SnPb36Ag2 and the effect of temperature on the mechanical durability of SAC305 appears to be minor. Failure analysis points out different failure modes such as ductile and brittle cracks at the interface between the solder bulk and the component, along with pad cratering-induced copper trace failures. FEA calculations provide data to estimate the high cycle fatigue (HCF) behavior of SAC305 solder under harmonic vibrations.
机译:振动引起的焊点疲劳是航空航天和军工行业的主要可靠性问题,这些领域的电子设备需要在这种负载下保持功能正常,这是航空航天和军工行业的主要可靠性问题。由于RoHS指令最终将阻止铅在电子系统中的使用,因此需要更好地了解振动条件下的无铅机械性能。这项研究报告了在三个特定温度(-55°C,20°C和105°C)下经受谐波吸引的Sn3.0Ag0.5Cu(SAC305)焊点的耐久性。设计了一个测试组件,该组件包含一个菊花链式1152 I / O球栅阵列(FBGA1152)封装,该封装组装在阻燃(FR-4)印刷电路板(PCB)上。振动水平是由板的中心以其固有频率在受控的挠度下施加的。监视电连续性以确定每个样品失效的循环次数。还使用扫描振动计进行模式形状测量,并将其与有限元分析(FEA)相关联,以确保准确计算组件拐角处关键焊球内的应力。然后将失效的样品横截面,以确定失效模式。比较了SAC305与SnPb36Ag2焊料的耐久性,并给出了两个互补组件的寿命测量结果:68个I / O无铅芯片载体(LCC68)和324个I / O塑料球栅阵列(PBGA324)。事实证明,SAC305的性能优于SnPb36Ag2,并且温度对SAC305的机械耐久性的影响似乎很小。失效分析指出了不同的失效模式,例如焊料块与元件之间的界面处的韧性和脆性裂纹,以及焊盘缩孔引起的铜走线失效。 FEA计算可提供数据,以估计SAC305焊料在谐波振动下的高周疲劳(HCF)行为。

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