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Mechanical fatigue assessment of SAC305 solder joints under harmonic and random vibrations

机译:SAC305焊点在谐波和随机振动下的机械疲劳评估

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摘要

Vibration-induced solder joint fatigue is a main reliability concern for aerospace and military industries whose electronic equipment used in the field is required to remain functional under harsh loadings. Due to the RoHS directive which eventually will prevent lead from being utilized in electronic systems, there is a need for a better understanding of lead-free mechanical behavior under vibration conditions. This study reports the durability of Sn3.0Ag0.5Cu (SAC305) solder joints subjected to harmonic solicitations at three specific temperatures (-55°C, 20°C and 105°C) and random vibrations at ambient temperature (20°C). A test assembly was designed and consisted in a single daisy-chained 1152 I/O ball grid array (FBGA1152) package assembled on a flame retardant (FR-4) printed circuit board (PCB). The vibration levels were imposed by a controlled deflection at the center of the board at its natural frequency. The electric continuity was monitored to determine the number of cycles to failure of each sample. Mode shape measurements with a scanning vibrometer were also conducted and correlated with finite element analysis (FEA) to ensure accurate calculation of strain within the critical solder balls at the corners of the component. The failed specimens were then cross-sectioned in order to determine failure modes. A comparison of SAC305 durability with SnPb36Ag2 solder is given, along with a set of lifetime measurements for two complementary assemblies: 68 I/O Leadless Chip Carrier (LCC68) and 324 I/O Plastic Ball Grid Array (PBGA324). For the tested harmonic vibration levels, SAC305 outperforms SnPb36Ag2. Furthermore, the effect of temperature on the mechanical durability of SAC305 appears to be minor. Failure analysis pointed out different failure modes on PCB and component side, along with pad cratering and copper trace failures. FEA calculations allows the determination of the SAC305 fatigue curve to estimate the high cycle fatigue (HCF) behavior of SAC305 solder under harmonic vibrations. The random vibrations durability of SAC305 solder was assessed using the same test assembly (FBGA1152) which was subjected to three different levels of Power Spectral Density (PSD) at 20°C. The random vibrations tests were conducted within a frequency band ranging from 500 Hz to 900 Hz around the natural frequency. The chosen PSD levels applied were 0.04, 0.10 and 0.20 g2/Hz. Using power-law fitting, the results give a first estimation of the durability of SAC305 solder joints subjected to random vibrations.
机译:振动引起的焊点疲劳是航空航天和军工行业的主要可靠性问题,在该领域中,需要在现场使用的电子设备在苛刻的负载下保持功能正常。由于RoHS指令最终将阻止铅在电子系统中的使用,因此需要更好地了解振动条件下的无铅机械性能。这项研究报告了Sn3.0Ag0.5Cu(SAC305)焊点在三种特定温度(-55°C,20°C和105°C)下受到谐波吸引以及在环境温度(20°C)下随机振动的耐久性。设计了一个测试组件,该组件包含一个菊花链式1152 I / O球栅阵列(FBGA1152)封装,该封装组装在阻燃(FR-4)印刷电路板(PCB)上。振动水平是由板的中心固有频率处的受控挠度引起的。监测电连续性以确定每个样品失效的循环次数。还使用扫描振动计进行模式形状测量,并将其与有限元分析(FEA)相关联,以确保准确计算组件拐角处关键焊球内的应变。然后将失效的样品横截面,以确定失效模式。比较了SAC305与SnPb36Ag2焊料的耐久性,并给出了两个互补组件的寿命测量结果:68个I / O无铅芯片载体(LCC68)和324个I / O塑料球栅阵列(PBGA324)。对于测试的谐波振动水平,SAC305优于SnPb36Ag2。此外,温度对SAC305的机械耐久性的影响似乎很小。故障分析指出了PCB和组件侧的不同故障模式,以及焊盘缩孔和铜走线故障。 FEA计算可确定SAC305疲劳曲线,以估算谐波振动下SAC305焊料的高周疲劳(HCF)行为。使用相同的测试组件(FBGA1152)对SAC305焊料的随机振动耐久性进行了评估,该组件在20°C下经受了三种不同水平的功率谱密度(PSD)。随机振动测试是在自然频率周围500 Hz至900 Hz的频带内进行的。所选的PSD施加的水平为0.04、0.10和0.20 g2 / Hz。使用幂律拟合,结果首次评估了经受随机振动的SAC305焊点的耐久性。

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