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Preparation of delafossite CuFeO2 thin films by rf-sputtering on conventional glass substrate

机译:在传统玻璃基板上通过射频溅射制备铜铁矿CuFeO2薄膜

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摘要

CuFeO2 CuFeO2 is a delafossite-type compound and is a well known p-type semiconductor. The growth of delafossite CuFeO2 thin films on conventional glass substrate by radio-frequency sputtering is reported. The deposition, performed at room temperature leads to an amorphous phase with extremely low roughness and high density. The films consisted of a well crystallized delafossite CuFeO2 after heat treatment at 450 °C in inert atmosphere. The electrical conductivity of the film was 1 mS/cm. The direct optical band gap was estimated to be 2 eV.
机译:CuFeO 2 CuFeO 2是铜铁矿型化合物,并且是众所周知的p型半导体。据报道,通过射频溅射在常规玻璃基板上生长了铜铁矿CuFeO2薄膜。在室温下进行的沉积导致具有极低粗糙度和高密度的非晶相。薄膜由结晶良好的铜铁矿CuFeO2组成,该铜铁矿在惰性气氛中于450°C热处理后。膜的电导率为1mS / cm。直接光学带隙估计为2 eV。

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