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Voltammetric determination of the critical micellar concentration of surfactants by using a boron doped diamond anode

机译:硼掺杂金刚石阳极伏安法测定表面活性剂的临界胶束浓度

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摘要

The electrochemistry of three surfactants has been studied by voltammetry at boron doped diamond (BDD) electrode in sodium sulphate solutions. The electrochemical behaviour of these surfactants is characterized by an oxidation signal (peak or wave) situated before the electrolyte oxidation. The anodic current is found to follow a linear relation with the concentration of the surfactants; the slope decreases abruptly above the critical micellar concentration (CMC) of the surfactants. The CMC values obtained for an anionic (sodium dodecylbenzenesulfonate, SDBS), a cationic (polyoxyethylene-23-dodecyl ether, BRIJ 35) and a neutral (1-(hexadecyl)trimethylammonium bromide, CTAB) surfactant are found in good agreement with those measured by the classical technique of surface tension. This voltammetric method has the advantage not to require the use of a redox active electrochemical probe.
机译:在硫酸钠溶液中的硼掺杂金刚石(BDD)电极上通过伏安法研究了三种表面活性剂的电化学。这些表面活性剂的电化学行为的特征在于位于电解质氧化之前的氧化信号(峰或波)。发现阳极电流与表面活性剂的浓度呈线性关系。斜率在表面活性剂的临界胶束浓度(CMC)以上突然降低。发现阴离子(十二烷基苯磺酸钠,SDBS),阳离子(聚氧乙烯-23-十二烷基醚,BRIJ 35)和中性(1-(十六烷基)三甲基溴化铵,CTAB)表面活性剂获得的CMC值与测得的CMC值高度吻合通过经典的表面张力技术。该伏安法的优点是不需要使用氧化还原活性电化学探针。

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