The dependence of band intensities in the Raman spectrum of individual single-crystal ruthenium dioxide (RuO2) nanowires on the angle between the plane of polarization of the exciting (and collected) light and the long axis of the nanowire, is shown to be a simple, complementary technique to high resolution transmission electron microscopy (HRTEM) for determining nanowire growth direction. We show that excellent agreement exists between what is observed and what is predicted for the polarization angle dependence of the intensities of the nanowires' E-g (525 cm(-1)) and the B-2g (714 cm(-1)) Raman bands, only by assuming that the nanowires grow along the (001) crystallographic direction, as confirmed by HRTEM.
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