We report the effect of an Al layer, covering the central part of the nanotube channel, on the electrical transport properties of carbon nanotube field-effect transistors (CNFETs). The CNFETs, consisting of single-walled carbon nanotube or double-walled carbon nanotube between two Pd electrodes on top of Si O2 layer, which showed p -type or ambipolar transport behaviors, exhibit clear n -type characteristics after the Al deposition. We ascribe such conversions into n -type behaviors to the electron doping in the Al-covered nanotube region, which results in the bending of the nanotube bands nearby the edges of the Al layer. This technique, Al deposition under a high vacuum, may give rise to a practical fabrication method for the n -type CNFET, which may enable us to develop complementary logic nanotube electronic devices.
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