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Systematic investigation on the ultratrace analytical monitoring of anionic surfactants on silicon wafer surface by capillary electrophoresis using designed experiments

机译：使用设计的实验通过毛细管电泳对硅片表面阴离子表面活性剂进行超痕量分析监测的系统研究

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HOO SIEOW CHENG;
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年度 2005
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正文语种 en
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1. Systematic Parameter Screening for Capillary Electrophoresis Monitoring of Surfactants on Silicon Wafer Surfaces by Designed Experiments [J] . S.C. Hoo, T. Wen, S.F.Y. Li, Journal of Chromatographic Science . 2006,第1期

机译：通过设计实验对硅晶片表面活性剂进行毛细管电泳监测的系统参数筛选
2. Ultra-trace analytical monitoring of silicon wafer surfaces by capillary electrophoresis [J] . T. Ehmann, L. Fabry, L. Kotz, Fresenius' Journal of Analytical Chemistry . 2001,第4期

机译：通过毛细管电泳对硅晶片表面进行超痕量分析监控
3. Ultra-trace analytical monitoring of silicon wafer surfaces by capillary electrophoresis [J] . T. Ehmann, L. Fabry, L. Kotz, Fresenius' Journal of Analytical Chemistry . 2001,第4期

机译：通过毛细管电泳对硅晶片表面进行超痕量分析监控
4. WSPS: WAFER SURFACE PREPARATION SYSTEM. A NOVEL MODULAR AUTOMATED METHOD CAPABLE OF THE ULTRATRACE ANALYTICAL INSPECTION OF 300 MM SILICON WAFER SURFACES [C] . Siegfried Pahlke, Ludwig Kotz, Thomas Ehmann, Silicon materials science and technology . 1998

机译：WSPS：晶圆表面制备系统。适用于300毫米硅晶片表面的超痕量分析检测的新型模块化自动方法
5. A systematic investigation of reactions that form silicon -carbon bonds between organic molecules and porous silicon surfaces [D] . Stewart, Michael P. 2001

机译：系统地研究有机分子与多孔硅表面之间形成硅碳键的反应
6. Investigations of the Mechanism of Gold Nanoparticle Stability and Surface Functionalization in Capillary Electrophoresis [O] . Michael R. Ivanov, Heidi R. Bednar, Amanda J. Haes -1

机译：毛细管电泳中金纳米颗粒稳定性和表面功能化机理的研究
7. Systematic Parameter Screening for Capillary Electrophoresis Monitoring of Surfactants on Silicon Wafer Surfaces by Designed Experiments [O] . S. C. Hoo, T. Wen, S. F. Y. Li, 2006

机译：通过设计实验，对硅晶片表面上表面活性剂的毛细管电泳监测的系统参数筛选

Systematic investigation on the ultratrace analytical monitoring of anionic surfactants on silicon wafer surface by capillary electrophoresis using designed experiments

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