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Systematic study of the normal and pumped state of high efficiency diamond particle detectors grown by chemical vapor deposition

机译:通过化学气相沉积法生长的高效金刚石颗粒探测器的正常和泵浦状态的系统研究

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摘要

The efficiency and charge collection distance (CCD) of nuclear particle detectors based on high quality diamond films grown by chemical vapor deposition (CVD) have been systematically studied as a function of the methane content in the growth gas mixture and for varying film thickness. The effects of preirradiation with β particles (pumping) have been thoroughly studied. The results fully support a recently proposed model [Marinelli et al., Appl. Phys. Lett. 75, 3216 (1999)] discussing the role of in-grain defects and grain boundaries in determining the charge collection spectra of CVD diamond films both in the normal and in the pumped state. The model allows us to quantitatively explain the dependence of CCD and efficiency on film thickness, giving a microscopic picture of the effects of preirradiation with ionizing radiation in CVD diamond films. The highest average CCD obtained is 145 μm in a 160 μm thick detector (corresponding to about 50% average efficiency), while the maximum value (about 70% efficiency) is close to 370 μm. In addition, CCD is shown to be higher than film thickness and to monotonically increase with thickness, indicating margins for further improvements. © 2001 American Institute of Physics.
机译:已经对基于通过化学气相沉积(CVD)生长的高质量金刚石膜的核粒子探测器的效率和电荷收集距离(CCD)进行了研究,其与生长气体混合物中甲烷含量的函数以及膜厚度的变化有关。已经对β粒子预照射(泵浦)的效果进行了深入研究。结果完全支持了最近提出的模型[Marinelli et al。,Appl。物理来吧75,3216(1999)]讨论了晶粒内缺陷和晶界在确定正常和泵浦状态下CVD金刚石膜的电荷收集光谱中的作用。该模型使我们能够定量地解释CCD和效率对薄膜厚度的依赖性,从而给出CVD金刚石薄膜中电离辐射预辐射影响的微观图。在160μm厚的检测器中,获得的最高平均CCD为145μm(相当于约50%的平均效率),而最大值(约70%的效率)接近370μm。另外,显示出CCD高于薄膜厚度,并且随着厚度单调增加,这表明有进一步改进的余地。 ©2001美国物理研究所。

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