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Ghosting and its recovery mechanisms in multilayer amorphous Selenium X-ray detectors

机译:多层非晶态硒X射线探测器的重影及其恢复机制

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摘要

During the last 15 years, many efforts have been directed towards the development of digital detectors for X-ray imaging. Direct conversion stabilized amorphous Selenium (a-Se)-based X-ray image detection with an active matrix array is one of the most widely used approaches which can provide excellent X-ray images, and is commercially available for mammography and general radiography. However, the X-ray sensitivity of a-Se detectors used in these systems changes as a result of previous X-ray exposures. This change in sensitivity which creates ghosting is recoverable by resting the detector for several hours. In this work, the physics of ghosting and its recovery mechanisms in multilayer a-Se detectors are experimentally and theoretically investigated. A numerical model is developed to study the time and exposure dependent X-ray sensitivity of multilayer a-Se X-ray imaging detectors on repeated X-ray exposures. This model considers accumulated trapped charges and their effects (trap filling, recombination, electric field profile, electric field dependent electron-hole pair creation energy), the carrier transport in the blocking layers, X-ray induced meta-stable deep trap center generations, and the effects of charge injection. The time dependent carrier detrapping and structural relaxation (recovery of meta-stable trap centers) are also considered. The continuity equations for both holes and electrons, trapping rate equations, and the Poisson's equation across the photoconductor for a step X-ray exposure are simultaneously solved by the Backward Euler finite difference method. It is found that the sensitivity in a rested sample is recovered mainly by the carrier detrapping and the recombination of the injected carriers with the existing trapped carriers. The sensitivity is expected to recover almost fully by resting the sample longer than the recovery time constant of the meta-stable trap centers. The theoretical model agrees well with the experimental results
机译:在过去的15年中,已经为开发用于X射线成像的数字检测器做出了许多努力。具有有源矩阵阵列的直接转换稳定的基于非晶硒(a-Se)的X射线图像检测是最广泛使用的方法之一,可以提供出色的X射线图像,并且可以在乳房X线照相术和普通X射线照相术中买到。但是,由于先前的X射线曝光,这些系统中使用的a-Se检测器的X射线灵敏度会发生变化。通过将检测器放置几个小时,可以恢复产生鬼影的灵敏度变化。在这项工作中,实验和理论上研究了多层a-Se探测器中重影的物理原理及其恢复机制。建立了一个数值模型来研究多层a-Se X射线成像探测器在重复X射线曝光下与时间和曝光有关的X射线灵敏度。该模型考虑了累积的陷阱电荷及其影响(陷阱填充,复合,电场分布,电场相关的电子-空穴对产生能),阻挡层中的载流子传输,X射线诱导的亚稳态深陷阱中心产生,以及电荷注入的影响。还考虑了与时间有关的载流子释放和结构弛豫(亚稳态陷阱中心的恢复)。同时使用Backward Euler有限差分法求解空穴和电子的连续性方程,俘获速率方程以及跨阶X射线曝光的光电导体上的泊松方程。可以发现,静置样品中的灵敏度主要是通过载流子的脱除以及注入的载流子与现有被捕获的载流子的重组而恢复的。通过放置样品的时间超过亚稳态阱中心的恢复时间常数,灵敏度有望几乎完全恢复。理论模型与实验结果吻合良好

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    Manouchehri Farzin;

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  • 年度 2008
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