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Searching for O-X-B mode-conversion window with monitoring of stray microwave radiation in LHD

机译:通过监视LHD中的杂散微波辐射搜索O-X-B模式转换窗口

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摘要

In the Large Helical Device, the stray microwave radiation is monitored by using so-called sniffer probes during electron cyclotron heating. In monitoring the stray radiation, we changed the microwave beam injection angle and search the O-X-B mode-conversion window to excite electron Bernstein waves (EBWs). When the microwave beam is injected toward the vicinity of the predicted O-X-B mode-conversion window, the electron temperature rises in the central part of overdense plasmas. In that case, the stray radiation level near the injection antenna becomes low. These results indicate that monitoring the stray radiation near the injection antenna is helpful in confirming the effectiveness of excitation of EBWs simply without precise analysis.
机译:在大型螺旋装置中,在电子回旋加速器加热期间,通过使用所谓的嗅探器探针来监测杂散微波辐射。在监视杂散辐射时,我们更改了微波束的注入角度,并搜索O-X-B模式转换窗口以激发电子伯恩斯坦波(EBW)。当向预测的O-X-B模式转换窗口附近注入微波束时,电子温度在过稠等离子体的中心部分升高。在这种情况下,注入天线附近的杂散辐射水平变低。这些结果表明,监测注入天线附近的杂散辐射有助于简单地确认EBW激发的有效性,而无需进行精确分析。

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