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Less expensive and high quality stopping criteria for MC-based analog IC yield optimization

机译:基于MC的模拟IC良率优化的廉价和高质量停止准则

摘要

This paper investigates the stopping criteria for Monte-Carlo (MC)-based yield optimization of analog integrated circuits. Available stopping criteria are briefly reviewed and a new adaptive criterion, called combined global and local improvement (ComImp) is presented. Experimental results show that the proposed stopping criterion has the following two advantages: (1) low risk of early termination before the optimum has been reached with the desired accuracy; (2) less additional function evaluations after the convergence has already been reached.
机译:本文研究了基于蒙特卡洛(MC)的模拟集成电路良率优化的停止标准。简要回顾了可用的停止标准,并提出了一种新的自适应标准,称为整体和局部改进(ComImp)。实验结果表明,提出的停止准则具有以下两个优点:(1)在以所需的精度达到最佳值之前提前终止的风险较低; (2)在已经达到收敛之后,较少的附加函数评估。

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