Practical test cores for the on-chip generation and evaluation of analog test signals: Application to a network/spectrum analyzer for analog BIST

摘要

This paper presents practical implementations of test cores for analog and mixed-signal BIST. A sinewave generator for test stimulus generation, and a periodical signal characterization system for response evaluation are discussed. Integrated prototypes and experimental results are provided, and a prototype of a network/spectrum analyzer featuring both test cores has been developed and tested in the lab.