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Direct chemical in-depth profile analysis and thickness quantification of nanometer multilayers using pulsed-rf-GD-TOFMS

机译：使用脉冲RF-GD-TOFMS对纳米多层膜进行直接化学深度分布分析和厚度定量

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7 páginas, 3 figuras, 2 tablas.-- et al.

机译：7页，3个数字，2个表。-等

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Martín José Ignacio; Quirós Carlos;
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年度 2010
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正文语种 eng
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1. Direct chemical in-depth profile analysis and thickness quantification of nanometer multilayers using pulsed-rf-GD-TOFMS [J] . Valledor R., Pisonero J., Bordel N., Analytical and bioanalytical chemistry . 2010,第8期

机译：使用脉冲RF-GD-TOFMS对纳米多层膜进行直接化学深度分布分析和厚度定量
2. Comparative depth-profiling analysis of nanometer-metal multilayers by ion-probing techniques [J] . R. Escobar Galindo, R. Gago, A. Lousa, TrAC: Trends in Analytical Chemistry . 2009,第4期

机译：离子探测技术对纳米金属多层膜的深度比较分析
3. Determination of in-depth density profiles of multilayer structures [J] . M. J. H. Kessels, F. Bijkerk, F. D. Tichelaar, Journal of Applied Physics . 2005,第9期

机译：多层结构深度密度分布的确定
4. In-Depth Analysis of Drilling Dynamics Data Solves Severe Vibration Issues Drilling Interbedded Sand/Shale Sequences in 3D-Directional Well Profiles [C] . J.E. Armour, R. Sankar, I. Thomson Latin American and Caribbean Petroleum Engineering Conference . 2009

机译：深入分析钻探动力学数据解决了3D方向井简档中钻孔夹层砂/页岩序列的严重振动问题
5. An In-Depth Analysis of Problem-Solving Profiles of Students in Open Online Environments. [D] . Balint, Trevor A. 2016

机译：开放在线环境中学生的问题解决档案的深度分析。
6. Direct Observation of Interfacial Dzyaloshinskii-Moriya Interaction from Asymmetric Spin-wave Propagation in W/CoFeB/SiO2 Heterostructures Down to Sub-nanometer CoFeB Thickness [O] . Avinash Kumar Chaurasiya, Chandrima Banerjee, Santanu Pan, -1

机译：从W / CoFeB / SiO2异质结构中的不对称自旋波传播直至亚纳米CoFeB厚度的界面Dzyaloshinskii-Moriya相互作用的直接观察
7. Direct chemical in-depth profile analysis and thickness quantification of nanometer multilayers using pulsed-rf-GD-TOFMS [O] . Valledor González Rebeca, Pisonero Castro Jorge, Bordel García Nerea, 2010

机译：使用脉冲RF-GD-TOFMS对纳米多层膜进行直接化学深度分布分析和厚度定量
8. An analysis of the coupled chemically reacting boundary layer and charring ablator. Part 2 - Finite difference solution for the in-depth response of charring materials considering surface chemical and energy balances [R] . Moyer, C. B., Rindal, R. A. 1968

机译：耦合化学反应边界层和炭化消融剂的分析。第2部分 - 考虑表面化学和能量平衡的炭化材料深度响应的有限差分解决方案

Direct chemical in-depth profile analysis and thickness quantification of nanometer multilayers using pulsed-rf-GD-TOFMS

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