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Low energy SIMS characterization of passive oxide films formed on a low-nickel stainless steel in alkaline media

机译:在碱性介质中低镍不锈钢上形成的钝化氧化膜的低能SIMS表征

摘要

Low-energy secondary ion mass spectrometry (SIMS) was used to study the oxide films formed on a low-nickel austenitic stainless steel (SS), potential replacement to conventional AISI 304 SS in reinforced concrete structures (RCS) that are subjected to aggressive environments. The effect of carbonation and the presence of chloride ions were studied. The oxide films formed a chemically gradated bi-layer structure with an outer layer predominately constituted by iron oxides and an inner layer enriched in chromium oxides. Chloride ions were not found in the oxide film but did have an effect on film structure and thickness. © 2013 Elsevier B.V. All rights reserved.
机译:低能二次离子质谱法(SIMS)用于研究在低镍奥氏体不锈钢(SS)上形成的氧化膜,可在遭受侵蚀性环境的钢筋混凝土结构(RCS)中替代常规AISI 304 SS 。研究了碳酸化作用和氯离子的存在。氧化膜形成化学分级的双层结构,其外层主要由氧化铁构成,而内层富含氧化铬。在氧化膜中未发现氯离子,但确实会影响膜的结构和厚度。 ©2013 Elsevier B.V.保留所有权利。

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