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X-ray fluorescence analytical criteria to assess the fineness of ancient silver coins: Application on Ptolemaic coinage

机译:评估古银币纯度的X射线荧光分析标准:在托勒密造币上的应用

摘要

The application of X-ray Fluorescence (XRF) analysis in a non-invasive manner on ancient silver coins may not provide reliable bulk compositional data due to possible presence of a surface, silver enriched layer. The present work proposes a set of three complementary analytical methodologies to assess and improve the reliability of XRF data in such cases: a) comparison of XRF data on original and cleaned micro-spots on coin surface, b) Ag K/L ratio test and c) comparison of experimental and theoretically simulated intensities of the Rayleigh characteristic radiation emitted from the anode. The proposed methodology was applied on 82 silver coins from the collection of Ioannes Demetriou, donated to the Numismatic Museum of Athens in the 1890s. The coins originate from different mints and are attributed to the first five Ptolemaic kings' reign (321-180 B.C.). They were analyzed in-situ by using a milli-probe XRF spectrometer. The presence of an Ag-enriched layer was excluded for the majority of them. The silver fineness was found to be high, with very low concentrations of copper and lead. The composition data provide important information about possible sources of silver during the Ptolemaic period and indications of a gradual coinage debasement after 270 B.C. due to economic or technical reasons. © 2011 Elsevier B.V. All rights reserved.
机译:由于可能存在表面的富银层,因此以无创方式在古代银币上进行X射线荧光分析(XRF)可能无法提供可靠的整体组成数据。本工作提出了三种互补的分析方法,以评估和提高XRF数据在这种情况下的可靠性:a)比较硬币表面原始和清洁微点上的XRF数据,b)Ag K / L比测试和c)比较阳极发射的瑞利特征辐射的实验强度和理论模拟强度。所提议的方法论被应用于1890年代捐赠给雅典钱币博物馆的来自Ioannes Demetriou的82枚银币。这些硬币来自不同的造币厂,并归功于前五个托勒密国王的统治(公元前321-180年)。使用毫探针XRF光谱仪对它们进行了原位分析。对于它们中的大多数,排除了富含Ag的层的存在。发现银细度高,并且铜和铅的浓度非常低。成分数据提供了有关托勒密时期可能的白银来源的重要信息,以及在公元前270年后铸币逐渐变质的迹象。由于经济或技术原因。 ©2011 Elsevier B.V.保留所有权利。

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