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Influence of the growth conditions on the stoichiometry and on the optical properties of titanium oxide thin films prepared by reactive sputtering

机译:生长条件对反应溅射制备二氧化钛薄膜化学计量和光学性能的影响

摘要

Titanium oxide thin films are deposited at room temperature by reactive DC sputtering onto glass and Si (100) substrates. Different conditions of deposition were varied such as sputtering power, deposition time and oxygen partial pressure to study their influence on the titanium oxide thin films growth. The absolute amount of oxygen and the relative O/Ti composition of films have been determined by Nuclear Reaction Analysis and Rutherford Backscattering Spectroscopy, respectively. Additionally, the band-gap was determined by measuring the optical absorption and its behavior correlated with the oxygen film content. From the present study, it is possible to establish that the optical band-gap energy depends mainly on the sputtering oxygen partial pressure used at the preparation and that films prepared with a partial oxygen pressure of 4 × 10- 2 Pa allows titanium oxide with near stoichiometric composition. Additionally, from the optical point of view, band-gap energies of 3.4 eV are obtained for near stoichiometric films and a decrease is observed for samples prepared with higher oxygen concentrations. © 2009 Elsevier B.V. All rights reserved.
机译:在室温下,通过反应性直流溅射将二氧化钛薄膜沉积到玻璃和Si(100)衬底上。改变沉积条件,例如溅射功率,沉积时间和氧分压,以研究它们对氧化钛薄膜生长的影响。膜的绝对氧含量和相对的O / Ti组成分别通过核反应分析和卢瑟福背散射光谱法确定。另外,带隙通过测量光吸收来确定,并且其行为与氧膜含量相关。根据目前的研究,可以确定光学带隙能量主要取决于制备中使用的溅射氧分压,并且以4×10- 2Pa的分氧压制备的薄膜允许氧化钛具有接近化学计量组成。另外,从光学角度来看,接近化学计量的薄膜获得的带隙能为3.4 eV,对于制备的具有更高氧气浓度的样品,其带隙能有所降低。 ©2009 Elsevier B.V.保留所有权利。

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