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Simultaneous imaging of the topography and dynamic properties of nanomechanical systems by optical beam deflection microscopy

机译：通过光束偏转显微镜同时成像的纳米力学系统的形貌和动态特性

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5 figuras, 5 páginas

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Kosaka Priscila M.; Tamayo de Miguel Francisco Javier; Gil-Santos Eduardo; Mertens Johann; Pini Valerio; Martínez N. F.;
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年度 2011
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正文语种 eng
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1. Simultaneous imaging of the topography and dynamic properties of nanomechanical systems by optical beam deflection microscopy [J] . P. M. Kosaka, J. Tamayo, E. Gil-Santos, Journal of Applied Physics . 2011,第6期

机译：通过光束偏转显微镜同时成像的纳米力学系统的形貌和动态特性
2. Systematic characterization of optical beam deflection measurement system for micro and nanomechanical systems [J] . R.W. Herfst, W.A. Klop, M. Eschen, Measurement . 2014,第Null期

机译：微米和纳米机械系统的光束偏转测量系统的系统表征
3. Development of multi-environment dual-probe atomic force microscopy system using optical beam deflection sensors with vertically incident laser beams [J] . Tsunemi, Eika, Kobayashi, Review of Scientific Instruments . 2013,第8期

机译：利用垂直入射激光束偏转传感器开发多环境双探针原子力显微镜系统
4. Simultaneous topography imaging and broadband nanomechanical property mapping using atomic force microscope [C] . Tianwei Li, Qingze Zou American Control Conference . 2017

机译：使用原子力显微镜同时进行地形成像和宽带纳米力学性能图
5. Optimization of Optical Beam Deflection Method for Bimodal Imaging on Atomic Force Microscopes [D] . Putnam, Jesse. 2020

机译：原子力显微镜对双峰成像光束偏转方法的优化
6. Piezoresistive AFM cantilevers surpassing standard optical beam deflection in low noise topography imaging [O] . Maja Dukic, Jonathan D. Adams, Georg E. Fantner -1

机译：低噪声地形成像中压阻AFM悬臂超过标准光束偏转
7. Development of dual-probe atomic force microscopy system using optical beam deflection sensors with obliquely incident laser beams [O] . Tsunemi Eika, Kobayashi Kei, Matsushige Kazumi, 2011

机译：斜入射激光束偏转传感器双探针原子力显微镜系统的开发

Simultaneous imaging of the topography and dynamic properties of nanomechanical systems by optical beam deflection microscopy

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