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Temperature dependence of surface acoustic wave propagation velocity in InxGa1-xN films obtained by high-resolution brillouin spectroscopy: Determination of temperature coefficient of frequency

机译:高分辨率布里渊光谱仪在InxGa1-xN薄膜中表面声波传播速度的温度依赖性:频率温度系数的确定

摘要

Temperature-dependent surface acoustic wave (SAW) propagation velocity and temperature coefficient of frequency (TCF) have been determined for the first time in InxGa1-xN alloys by means of high-resolution Brillouin spectroscopy (HRBS). HRBS offers an alternative way of determining TCF. The obtained TCF values present a non-linear behavior with the In concentration. TCF of pure InN (-13.75 ppm/K) is similar to those of AlN and GaN (-19 and -17.7 ppm/K, respectively). InxGa1-xN samples exhibit frequency values that are very stable against temperature changes, which makes InxGa1-xN a good candidate for current SAW-based technological applications.
机译:通过高分辨率布里渊光谱(HRBS)首次确定了InxGa1-xN合金中随温度变化的表面声波(SAW)传播速度和频率温度系数(TCF)。 HRBS提供了一种确定TCF的替代方法。所获得的TCF值与In浓度呈非线性关系。纯InN(-13.75 ppm / K)的TCF与AlN和GaN(分别为-19和-17.7 ppm / K)的TCF相似。 InxGa1-xN样品的频率值对于温度变化非常稳定,这使得InxGa1-xN成为当前基于SAW的技术应用的理想之选。

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