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Industrial computer tomography for dimensional metrology: Overview of influence factors and improvement strategies

机译:用于尺寸计量的工业计算机断层扫描:影响因素和改进策略概述

摘要

While Computer Tomography (CT) has since long been used for medical applications and material inspection, its application field has recently been broadened to include dimensional metrology in industry. In particular, it provides a unique means of measuring assemblies, complex structures as well as the inner geometry of parts made by rapid manufacturing in a non-destructive way. However, the accuracy of CT-based measurements remains yet largely uncertain, due to a number of influencing factors related to the workpiece, the CT equipment as well as the measurement setup. This paper first classifies the factors influencing the CT performance on the basis of the basic components of the CT system. Next, the obtained knowledge is used to suggest improvement strategies to ameliorate the accuracy of CT measurements.
机译:尽管计算机断层扫描(CT)长期以来一直用于医疗应用和材料检查,但其应用领域最近已扩大到包括工业领域的尺寸计量。特别是,它提供了一种独特的方法来测量组件,复杂结构以及通过无损快速制造而成的零件的内部几何形状。但是,由于与工件,CT设备以及测量设置相关的许多影响因素,基于CT的测量的准确性仍然很大程度上不确定。本文首先根据CT系统的基本组成对影响CT性能的因素进行分类。接下来,将获得的知识用于建议改进策略以改善CT测量的准确性。

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