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Dynamics in ultrathin liquid films studied by simultaneous dielectric spectroscopy (DRS) and organic molecular beam deposition (OMBD)

机译:通过同时介电谱(DRS)和有机分子束沉积(OMBD)研究的超薄液膜动力学

摘要

Real-time dielectric relaxation spectroscopy for a molecular beam deposited glass forming liquids is proposed as a versatile approach for the study of the dynamic glass transition in geometric confinement. To achieve the highestsensitivity down to monomolecular organic layers in a wide frequency range (0.1 - 10^7 Hz) during simultaneous deposition and desorption, we have used μm spacedinterdigitated electrodes under ultrahigh vacuum conditions. Experiments using glycerol deposited on fused silica at -40◦C revealed a dielectric glass transitionprocess for a layer thickness as low as 0.7 nm. While its peak position hardly changes upon thickness reduction, a clear broadening of the relaxation peak is observedthat implies an increasing heterogeneous mobility scenario for the thinnest films caused by molecules being part of a reduced (at the substrate) or enhanced (free surface) mobility layer. This finding is supported by desorption experiments that reveal a strong retardation of the desorption rate for films below 1 nm.
机译:提出了一种用于分子束沉积的玻璃形成液的实时介电弛豫光谱技术,作为研究几何约束中动态玻璃化转变的通用方法。为了在同时沉积和脱附过程中在宽频率范围(0.1-10 ^ 7 Hz)中对单分子有机层实现最高灵敏度,我们在超高真空条件下使用了μm间距的叉指电极。使用在-40°C下沉积在熔融石英上的甘油进行的实验表明,介电玻璃化过程的层厚度低至0.7 nm。虽然其峰值位置在厚度减小时几乎不会改变,但观察到弛豫峰明显变宽,这意味着由分子(在基底上)或增强的(自由表面)迁移层的一部分引起的最薄薄膜的异质迁移率场景增加。这一发现得到解吸实验的支持,该实验揭示了低于1 nm的薄膜的解吸速率有很强的延迟。

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