首页> 外文OA文献 >Closer look at the low-frequency dynamics of vortex matter using scanning susceptibility microscopy
【2h】

Closer look at the low-frequency dynamics of vortex matter using scanning susceptibility microscopy

机译:使用扫描磁化率显微镜仔细观察涡旋物质的低频动力学

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

Using scanning susceptibility microscopy, we shed light on the dynamics of individual superconducting vortices and examine the hypotheses of the phenomenological models traditionally used to explain the macroscopic ac electromagnetic properties of superconductors. The measurements, carried out on a 2H-NbSe2 single crystal at relatively high temperature (T = 6.8 K), show a linear amplitude dependence of the global ac susceptibility for excitation amplitudes between 0.3 and 2.6 Oe. We observe that the low amplitude response, typically attributed to the oscillation of vortices in a potential well defined by a single, relaxing, Labusch constant, actually corresponds to strongly nonuniform vortex shaking. This is particularly pronounced in the field-cooled disordered phase, which undergoes a dynamic reorganization above 0.8 Oe as evidenced by the healing of lattice defects and a more uniform oscillation of vortices. These observations are corroborated by molecular dynamics simulations when choosing the microscopic input parameters from the experiments. The theoretical simulations allow us to reconstruct the vortex trajectories, providing deeper insight into the thermally induced hopping dynamics and the vortex lattice reordering.
机译:使用扫描磁化显微镜,我们揭示了单个超导涡旋的动力学,并检验了传统上用来解释超导体的宏观交流电磁特性的现象学模型的假设。在2H-NbSe2单晶上在相对较高的温度(T = 6.8 K)上进行的测量表明,对于0.3至2.6 Oe的激发幅度,全局磁化率的线性幅度依赖性。我们观察到,低振幅响应(通常归因于由单个,松弛的Labusch常数定义的势阱中的旋涡振荡)实际上对应于强烈的非均匀旋涡。这在现场冷却的无序相中尤为明显,该相在0.8 Oe以上经历了动态重组,这由晶格缺陷的修复和涡旋的更均匀振荡所证明。从实验中选择微观输入参数时,分子动力学模拟证实了这些观察结果。理论仿真使我们能够重建涡旋轨迹,从而更深入地了解热诱发的跳跃动力学和涡旋晶格的重新排序。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号